Theoretical Modeling of Secondary Electron Yield Using First-Principles Input: Comparison with Experimental Measurements

Abstract

Secondary electron yield of a material is a crucial factor in designing many electronic devices, from electron multipliers to high-power radio frequency devices used in the aerospace industry. In the latter, it is key in mitigating the highly destructive multipactor, where a low value of secondary electron yield is desired. In this work we present results for select elemental metals obtained using a newly developed, state-of-the-art, Monte Carlo code for modeling secondary electron emission with entirely first principle input. The results are compared with the available experimental data.