Intelligent Health Monitoring System Hardware Design for Paralleled Devices with Fast Dv/dt Output

Haoyang You, Han Wang, Jayanth Reddy Regatti, Jon Hall, Alec Schnabel, Boxue Hu, Julia Zhang, Abhishek Gupta, Jin Wang
{"title":"Intelligent Health Monitoring System Hardware Design for Paralleled Devices with Fast Dv/dt Output","authors":"Haoyang You, Han Wang, Jayanth Reddy Regatti, Jon Hall, Alec Schnabel, Boxue Hu, Julia Zhang, Abhishek Gupta, Jin Wang","doi":"10.1109/IEMDC47953.2021.9449599","DOIUrl":null,"url":null,"abstract":"With the increasing power rating of wide bandgap (WBG) devices in parallel, the system reliability encounters unprecedented challenges. Artificial intelligence (AI) methods could be introduced to monitor device health conditions and realize intelligent control for each device. In this paper, an intelligent health monitoring system is designed for the future AI implementation for paralleled devices with a fast dv/dt output. The detailed system circuitry and layout are discussed. The proposed system consists of monitoring and control functions. For the monitoring function, a measurement board is designed to capture the device temperature, turn on and turn off drain-to-source voltage, drain-to-source current. For the control function, a gate drive board is shown with the ability to select various gate voltage and gate resistance based on the control signals. Experimental verifications are provided at the end.","PeriodicalId":106489,"journal":{"name":"2021 IEEE International Electric Machines & Drives Conference (IEMDC)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-05-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Electric Machines & Drives Conference (IEMDC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMDC47953.2021.9449599","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

With the increasing power rating of wide bandgap (WBG) devices in parallel, the system reliability encounters unprecedented challenges. Artificial intelligence (AI) methods could be introduced to monitor device health conditions and realize intelligent control for each device. In this paper, an intelligent health monitoring system is designed for the future AI implementation for paralleled devices with a fast dv/dt output. The detailed system circuitry and layout are discussed. The proposed system consists of monitoring and control functions. For the monitoring function, a measurement board is designed to capture the device temperature, turn on and turn off drain-to-source voltage, drain-to-source current. For the control function, a gate drive board is shown with the ability to select various gate voltage and gate resistance based on the control signals. Experimental verifications are provided at the end.
快速Dv/dt输出并联设备智能健康监测系统硬件设计
随着宽带隙(WBG)器件并联功率的不断提高,系统可靠性面临着前所未有的挑战。引入人工智能方法监测设备健康状况,实现对每台设备的智能控制。本文设计了一种智能健康监测系统,用于具有快速dv/dt输出的并联设备的未来AI实现。详细讨论了系统电路和布局。所提出的系统包括监测和控制功能。为了实现监控功能,设计了一个测量板来捕获器件温度,接通和关闭漏源极电压,漏源极极电流。对于控制功能,栅极驱动板具有根据控制信号选择各种栅极电压和栅极电阻的能力。最后给出了实验验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信