Characterization of Thin-Film Optical Properties by THz Near-Field Imaging

Abstract

We present a method for characterization of thin-film eletro-or magneto-optic materials. Our tool is based on resolving the electric and magnetic field distributions in the near field of a split ring resonator (SRR) designed for the terahertz frequency range. Here, we experimentally validate our simulations by near-field THz imaging of a SRR directly patterned in contact with a thin-film lithium niobate crystal.