Strain Gauges by variation of differential birefringence

P. Lelong, V. Simonet, J. Charmet
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Abstract

The strain-gauge here after described is a purely optical device which makes possible to determine the strains by measuring differential birefringence between two elliptically polarized light beams. Measurements on dielectric material are more performing with this optical strain gauge than with a conventional electrical one. Sensitivities can reach 5.10-6 for strain measurements and one micron for transverse displacements.
微分双折射变化应变计
本文描述的应变计是一种纯光学装置,它可以通过测量两束椭圆偏振光之间的微分双折射来确定应变。用这种光学应变计对介电材料的测量比用传统的电学应变计更有效。灵敏度可以达到5.10-6应变测量和1微米的横向位移。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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