A model for power-supply noise injection in long interconnects

Abstract

For long interconnects, the power-supply noise injected through the repeaters can be more critical than crosstalk simply because there is no easy way to get rid of it. This paper rigorously analyzes the injection mechanism using a novel device model. A closed-form expression quantifying the interconnect delay variations caused by the noise is derived. For typical 130-nm interconnects, the model is shown to be very accurate.