High-breakdown and high-linearity Ga/sub 0.51/In/sub 0.49/P/In/sub 0.15/Ga/sub 0.85/As pseudomorphic HEMT

Abstract

High-breakdown and high-linearity Ga/sub 0.51/In/sub 0.49/P/In/sub 0.15/Ga/sub 0.85/As pseudomorphic HEMTs have been fabricated successfully and demonstrated. A extremely high gate-to-drain breakdown voltage of 40 V is obtained by using a wide-gap Ga/sub 0.51/In/sub 0.49/P Schottky contact layer. For a 1 /spl mu/m-gate length device, the transconductance and output current density at room temperature are 90 mS/mm and 646 mA/mm, respectively. The measured f/sub T/ and f/sub max/ are 12 and 28.4 GHz, respectively. Therefore, the studied device shows a promise for microwave power applications.