Measuring the coverage of node shorts by internal access methods

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI:10.1109/VTEST.1991.208161

W. Debany

引用次数: 3

Abstract

A method is presented that determines the coverage of shorts (bridging failures) by internal access techniques that provide node observability such as CMOS I/sub DD/ monitoring, CrossCheck, and voltage contrast. This method requires neither fault simulation nor listing of faults, and it is exact.<>

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通过内部访问方法测量节点短路的覆盖率

提出了一种方法，通过提供节点可观察性的内部访问技术(如CMOS I/sub DD/监控、CrossCheck和电压对比)来确定短路(桥接故障)的覆盖范围。该方法既不需要模拟故障，也不需要列举故障，具有较好的准确性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's

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