3-dimensional memory module assembly technology

Y. Kyouogku, Y. Yamaguti, K. Ohkubo
{"title":"3-dimensional memory module assembly technology","authors":"Y. Kyouogku, Y. Yamaguti, K. Ohkubo","doi":"10.1109/IEMTIM.1998.704634","DOIUrl":null,"url":null,"abstract":"In order to meet the demand for higher density and greater capacity, a three dimensional memory module has been developed. NEC has developed a new type of 3D memory module which uses single memory module stacking technology. It satisfies the demands for higher packaging density using a simple structure. The reliability of the single memory modules and 3D memory module was tested using 16 Mb DRAM chips. The results suggest that our 3D memory modules have good reliability. With our dual in-line memory modules (DIMM), no breaks in the solder bonds between single memory modules and motherboard were observed over 3000 cycles of thermal cycling testing.","PeriodicalId":260028,"journal":{"name":"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMTIM.1998.704634","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

In order to meet the demand for higher density and greater capacity, a three dimensional memory module has been developed. NEC has developed a new type of 3D memory module which uses single memory module stacking technology. It satisfies the demands for higher packaging density using a simple structure. The reliability of the single memory modules and 3D memory module was tested using 16 Mb DRAM chips. The results suggest that our 3D memory modules have good reliability. With our dual in-line memory modules (DIMM), no breaks in the solder bonds between single memory modules and motherboard were observed over 3000 cycles of thermal cycling testing.
三维内存模块组装技术
为了满足更高密度和更大容量的需求,开发了三维存储模块。NEC开发了一种新型3D存储模块,该模块采用了单个存储模块堆叠技术。它以简单的结构满足了更高的包装密度的要求。采用16mb的DRAM芯片,测试了单内存模块和3D内存模块的可靠性。结果表明,我们的三维存储模块具有良好的可靠性。使用我们的双列式内存模块(DIMM),在超过3000次的热循环测试中,没有观察到单个内存模块和主板之间的焊接键断裂。
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