Studying the Influence of Weak Impulses Magnetic Field on Local Properties Ribbon Amorphous Alloys Fe(Ni, Cu)(SiB)

T. Kaminskaya, M. Stepovich, M. Shipko, A. Tihonov, V. Popov
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Abstract

Atomic force microscopy and magnetic force microscopy have been used to study the influence of weak magnetic field pulses on the local properties of ribbon amorphous Fe(Ni, Cu)(SiB) alloys about 100 µm thick, 10 mm wide, and 50 mm long, which were obtained by ultrafast cooling of the melt on a rotating copper drum. On the surface of the tape adjacent to the copper drum, there were practically no areas with low rough-ness, which did not allow subsequent studies of this side of the tape by magnetic force microscopy. This method was used to investigate another, free surface of the foil, which was not adjacent to the copper drum and did not have significant roughness. Prior to the impact of magnetic field pulses on the foil, no magnetic contrast was observed on the free side of the ribbon. After magnetic pulse processing, a magnetic contrast was registered on this side of the foil: stripe domains 0.6–0.8 μm wide became visible, and closing domains, became visible on structural defects, wedge-shaped Neel domains, from 1 µm to 1.6 µm wide. The results of the study allow us to say that the magnetization reversal losses are to a large extent associated with losses due to eddy currents and are associated with the domain width, which depends slightly on the modes of magnetic pulse processing. The obtained results of the research can be used to refine the method for relieving stresses arising in the process of manufacturing amorphous ribbons.
弱脉冲磁场对带状非晶合金Fe(Ni, Cu)(SiB)局部性能影响的研究
采用原子力显微镜和磁力显微镜研究了弱磁场脉冲对在旋转铜鼓上对熔体进行超快冷却制备的约100µm厚、10 mm宽、50 mm长的带状非晶态Fe(Ni, Cu)(SiB)合金局部性能的影响。在铜鼓附近的胶带表面,几乎没有低粗糙度的区域,这使得后续的磁力显微镜无法对胶带的这一面进行研究。该方法用于研究箔的另一个自由表面,该表面不与铜鼓相邻并且没有显着的粗糙度。在磁场脉冲对箔的影响之前,在条带的自由侧没有观察到磁性对比。经过磁脉冲处理后,在箔的这一侧进行了磁对比:可以看到0.6-0.8 μm宽的条纹域,并且可以在结构缺陷上看到闭合域,即1 μm至1.6 μm宽的楔形Neel域。研究结果表明,磁化反转损耗在很大程度上与涡流损耗有关,并与畴宽有关,而畴宽与磁脉冲处理方式有轻微的关系。所得结果可用于改进非晶带制造过程中产生的应力消除方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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