Reliability testing for non-constant MTBFs

IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology' Pub Date : 1988-03-21 DOI:10.1109/REG5.1988.15937

J.R. Franck

引用次数: 3

Abstract

The mean time between failures (MTBF) of new products has been found to increase with time due to the decreasing number of process problems and design problems found as test time is accumulated. The author's purpose is to show one method of considering this when developing a probability ratio sequential test plan (PRST). The method results in a shorter test time to an accept decision for a product with a high MTBF and a longer test time to a reject decision for a product with a low MTBF.<>

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非恒定mtbf的可靠性测试

新产品的平均故障间隔时间(MTBF)随着时间的推移而增加，因为随着测试时间的积累，发现的工艺问题和设计问题数量减少。作者的目的是展示在开发概率比顺序测试计划(PRST)时考虑这一点的一种方法。对于MTBF高的产品，该方法可以缩短接受决策的测试时间，而对于MTBF低的产品，该方法可以延长拒绝决策的测试时间。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'

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