Microelectronics reliability

IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology' Pub Date : 1900-01-01 DOI:10.1109/REG5.1988.15935

J.W. Meredith

引用次数: 71

Abstract

The author points out the importance of the involvement of the design and manufacturing team in achieving reliability of microelectronic devices. A method of verifying reliability goals through calculation of failure rates based on life test parameters is described. An example illustrating the method is shown.<>

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微电子的可靠性

作者指出了设计和制造团队的参与对实现微电子器件可靠性的重要性。介绍了一种基于寿命试验参数计算故障率来验证可靠性目标的方法。给出了一个示例来说明该方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'

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