Effect of substrate resistivity on switching noise in on-chip power distribution networks

J. Mao, Madhavan Swaminathan, J. Libous, D. O'Connor
{"title":"Effect of substrate resistivity on switching noise in on-chip power distribution networks","authors":"J. Mao, Madhavan Swaminathan, J. Libous, D. O'Connor","doi":"10.1109/EPEP.2003.1249994","DOIUrl":null,"url":null,"abstract":"This paper describes the effect of substrate loss on simultaneous switching noise (SSN) in on-chip power distribution networks (PDN). Conformal mapping and first-order Debye approximation based Finite Difference Time Domain (FDTD) have been used for model extraction and time domain simulation with frequency dependent parameters, respectively. The importance of substrate loss on power supply noise has been quantified in this paper.","PeriodicalId":254477,"journal":{"name":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2003.1249994","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 17

Abstract

This paper describes the effect of substrate loss on simultaneous switching noise (SSN) in on-chip power distribution networks (PDN). Conformal mapping and first-order Debye approximation based Finite Difference Time Domain (FDTD) have been used for model extraction and time domain simulation with frequency dependent parameters, respectively. The importance of substrate loss on power supply noise has been quantified in this paper.
片上配电网中衬底电阻率对开关噪声的影响
本文描述了衬底损耗对片上配电网络(PDN)中同时开关噪声的影响。采用保角映射和基于一阶德拜近似的时域有限差分(FDTD)分别进行了频率相关参数的模型提取和时域仿真。本文定量分析了衬底损耗对电源噪声的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信