Low power self refresh mode DRAM with temperature detecting circuit

Y. Kagenishi, H. Hirano, A. Shibayama, H. Kotani, N. Moriwaki, M. Kojima, T. Sumi
{"title":"Low power self refresh mode DRAM with temperature detecting circuit","authors":"Y. Kagenishi, H. Hirano, A. Shibayama, H. Kotani, N. Moriwaki, M. Kojima, T. Sumi","doi":"10.1109/VLSIC.1993.920531","DOIUrl":null,"url":null,"abstract":"To reduce self refresh mode current, a temperature detecting circuit, back bias generator and voltage down convertor, are developed. Using these circuits in a 16M DRAM, 33 /spl mu/A consuming current in self refresh mode has been realized at Vcc=5V, Ta=25 /spl deg/C.","PeriodicalId":127467,"journal":{"name":"Symposium 1993 on VLSI Circuits","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Symposium 1993 on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.1993.920531","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24

Abstract

To reduce self refresh mode current, a temperature detecting circuit, back bias generator and voltage down convertor, are developed. Using these circuits in a 16M DRAM, 33 /spl mu/A consuming current in self refresh mode has been realized at Vcc=5V, Ta=25 /spl deg/C.
具有温度检测电路的低功耗自刷新模式DRAM
为了减小自刷新模式电流,设计了温度检测电路、反偏置发生器和降压变换器。利用这些电路在16M DRAM中,在Vcc=5V, Ta=25 /spl度/C时实现了33 /spl mu/ a的自刷新模式消耗电流。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信
小红书