{"title":"Explosive Contamination from Substrate Surfaces: Differences and Similarities in Contamination Techniques Using RDX and C-4","authors":"C. Miller, T. Yoder","doi":"10.1007/S11220-010-0053-Y","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":166802,"journal":{"name":"Sensing and Imaging: An International Journal","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Sensing and Imaging: An International Journal","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/S11220-010-0053-Y","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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