Analysis of leakage in multilayered microstrip lines using complex images

Abstract

the mixed potential integral equation (MPIE) is combined with the complex image method to analyze the complete spectrum of multilayered printed transmission lines. A relevant contribution of this method is its ability to study both the bound and leaky regimes in a very simple and efficient way. Since the analysis is carried out in the spatial domain, this work also makes it possible to analyze the leakage phenomenon for structures with nonzero thickness conductors.