A. Zatsarinny, Y. Stepchenkov, Y. Diachenko, Yury Rogdestvenski, L. Plekhanov
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引用次数: 0
Abstract
The article considers the problem of developing synchronous and self-timed (ST) circuits that are tolerant to faults. Redundant ST coding and two-phase discipline ensures that ST circuits are more tolerant to the faults than synchronous counterparts. Duplicating ST channels instead of tripling reduces redundancy of the fault-tolerant ST circuits and retains their reliability level compared to synchronous counterparts