{"title":"Application of the MEBS SOURCE software package to high voltage electron gun design","authors":"E. Munro, X. Zhu, J. Rouse","doi":"10.1109/IVELEC.2004.1316356","DOIUrl":null,"url":null,"abstract":"We report on results of the high-voltage electron guns modeling with MEBS SOURCE software, where not only gun electron-optical properties, but high-voltage isolation have been analyzed and optimized successfully.","PeriodicalId":283559,"journal":{"name":"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVELEC.2004.1316356","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We report on results of the high-voltage electron guns modeling with MEBS SOURCE software, where not only gun electron-optical properties, but high-voltage isolation have been analyzed and optimized successfully.