Reliability-aware data placement for partial memory protection in embedded processors

M. Mehrara, T. Austin
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引用次数: 3

Abstract

Low cost protection of embedded systems against soft errors has recently become a major concern. This issue is even more critical in memory elements that are inherently more prone to transient faults. In this paper, we propose a reliability aware data placement technique in order to partially protect embedded memory systems. We show that by adopting this method instead of traditional placement schemes with complete memory protection, an acceptable level of fault tolerance can be achieved while incurring less area and power overhead. In this approach, each variable in the program is placed in either protected or non-protected memory area according to the profile-driven liveness analysis of all memory variables. In order to measure the level of fault coverage, we inject faults into the memory during the course of program execution in a Monte Carlo simulation framework. Subsequently, we calculate the coverage of partial protection scheme based on the number of protected, failed and crashed runs during the fault injection experiment.
嵌入式处理器中部分内存保护的可靠性感知数据放置
嵌入式系统对软错误的低成本保护最近成为人们关注的主要问题。这个问题在内存元素中更为关键,因为内存元素本身就更容易发生瞬态故障。为了对嵌入式存储系统进行部分保护,提出了一种可靠性感知的数据放置技术。我们的研究表明,采用这种方法取代具有完整内存保护的传统放置方案,可以在产生更少的面积和功耗开销的同时实现可接受的容错水平。在这种方法中,程序中的每个变量根据所有内存变量的概要驱动的活动性分析被放置在受保护或不受保护的内存区域中。在蒙特卡罗仿真框架中,我们在程序执行过程中将故障注入到内存中,以测量故障覆盖的程度。然后,根据故障注入实验中被保护、失败和崩溃的运行次数计算部分保护方案的覆盖率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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