A novel circuit diagnostic technique using electro-optic sampling

International Topical Meeting on Microwave Photonics. MWP '96 Technical Digest. Satellite Workshop (Cat. No.96TH8153) Pub Date : 1996-12-03 DOI:10.1109/MWP.1996.662114

S. Wakana, K. Ozaki, H. Sekiguchi, Y. Goto, Y. Umehara, J. Matsumoto

引用次数: 0

Abstract

We have developed a novel probing system for internal node diagnostics. This probe uses an electro-optic sampling technique. It has sub-/spl mu/m spatial resolution, a few mV voltage resolution and 100 ps temporal resolution. The prototype system has a measurement bandwidth of 3 GHz.

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一种新的电光采样电路诊断技术

我们开发了一种用于内部节点诊断的新型探测系统。该探头采用电光采样技术。它具有亚/spl μ m的空间分辨率，几mV的电压分辨率和100 ps的时间分辨率。原型系统的测量带宽为3ghz。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

International Topical Meeting on Microwave Photonics. MWP '96 Technical Digest. Satellite Workshop (Cat. No.96TH8153)

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