A device based on the Shack-Hartmann wave front sensor for testing wide aperture optics

SPIE OPTO Pub Date : 2016-03-16 DOI:10.1117/12.2219282
A. Nikitin, J. Sheldakova, A. Kudryashov, G. Borsoni, D. Denisov, V. Karasik, A. Sakharov
{"title":"A device based on the Shack-Hartmann wave front sensor for testing wide aperture optics","authors":"A. Nikitin, J. Sheldakova, A. Kudryashov, G. Borsoni, D. Denisov, V. Karasik, A. Sakharov","doi":"10.1117/12.2219282","DOIUrl":null,"url":null,"abstract":"In this paper we consider two approaches widely used in testing of wide aperture optics: Fizeau interferometer and Shack-Hartmann wavefront sensor. Fizeau interferometer that is common instrument in optical testing can be transformed to a device using Shack-Hartmann wavefront sensor, the alternative technique to check wide aperture optical components. We call this device Hartmannometer, and compare its features to those of Fizeau interferometer.","PeriodicalId":122702,"journal":{"name":"SPIE OPTO","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SPIE OPTO","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2219282","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21

Abstract

In this paper we consider two approaches widely used in testing of wide aperture optics: Fizeau interferometer and Shack-Hartmann wavefront sensor. Fizeau interferometer that is common instrument in optical testing can be transformed to a device using Shack-Hartmann wavefront sensor, the alternative technique to check wide aperture optical components. We call this device Hartmannometer, and compare its features to those of Fizeau interferometer.
基于Shack-Hartmann波前传感器的大孔径光学测试装置
本文考虑了两种广泛应用于大孔径光学器件测试的方法:菲索干涉仪和沙克-哈特曼波前传感器。菲索干涉仪是一种常用的光学检测仪器,利用沙克-哈特曼波前传感器可以将菲索干涉仪改造成一种检测大口径光学元件的替代技术。我们称这种装置为哈特曼干涉仪,并将其特点与菲索干涉仪进行比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信