Xueshen Wang, Tianyi Li, D. Cox, J. Gallop, Jinjin Li, Y. Zhong, W. Cao, Q. Zhong, Zhun Li, Mingyu Zhang, L. Hao
{"title":"Investigation of niobium nanoSQUIDs based on nanobridge junctions","authors":"Xueshen Wang, Tianyi Li, D. Cox, J. Gallop, Jinjin Li, Y. Zhong, W. Cao, Q. Zhong, Zhun Li, Mingyu Zhang, L. Hao","doi":"10.1109/CPEM.2016.7540718","DOIUrl":null,"url":null,"abstract":"NanoSQUIDs with Dayem nanobridge weak-link junctions were fabricated on single layer niobium film by focus ion beam(FIB) milling. The dimension of the nanobridge is less than 60 nm and the loop scale is from 400×400 nm to 2.5×20 μm. The working temperature range for this device was researched. The voltage-flux transfer properties were measured at different working temperatures.","PeriodicalId":415488,"journal":{"name":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","volume":"274 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.2016.7540718","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
NanoSQUIDs with Dayem nanobridge weak-link junctions were fabricated on single layer niobium film by focus ion beam(FIB) milling. The dimension of the nanobridge is less than 60 nm and the loop scale is from 400×400 nm to 2.5×20 μm. The working temperature range for this device was researched. The voltage-flux transfer properties were measured at different working temperatures.