Package Design Optimization of the Fan-out Interposer System

Sang Kyu Kim, Sangwook Park, S. Cha, Sang Nam Jung, Gyongbum Kim, D. Oh, Joonsung Kim, Sang-Uk Kim, Seok Won Lee
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Abstract

The state of the art high-speed digital systems for artificial intelligence, 5G mobile communication, and network servers demand enormous amount of data transmission, wider bandwidth, and faster data rate than the conventional technology. This requires packages to incorporate interconnects with very high density, but to provide cost effective manufacturing process and better performance at the same time. The new hybrid package platform based on the panel level package (PLP) interposer mounted on the high density interconnect (HDI) substrate can be a promising solution for these requirements. The PLP interposer can provide fine pitch to support considerable number of signal traces while the HDI substrate can be served as relatively inexpensive interconnects after fanning-out signals out of the interposer. Another merit of the PLP interposer is to provide lower inductance from bump to package decoupling capacitors when implementing land side capacitors underneath the PLP interposer because the PLP can have thinner substrate thickness than the Ajinomoto build-up film (ABF). The ABF interposer can be an alternative to the PLP interposer. Although the ABF interposer has thicker copper and dielectric layers than the PLP interposer, it can achieve lower resistance for the required characteristic impedance of the high-speed IO. However, the presence of joint balls between the interposer and the HDI substrate can introduce additional impedance discontinuities, which can degrade the signal integrity. Hence, optimized package design and analysis are key factors for designing such package platforms. In this paper, the PLP interposer, the ABF interposer, and the conventional package are compared for the package structure and the design optimization perspectives. Each package platform topology is illustrated, its merits and risks are discussed. For the design optimization, the traces on the interposers and the substrates are described by simple T-line models while the LC model is adopted for vertical structures including vias, pads, and balls. The benefit of using the simple model is to provide the package design guide for the performance optimization of the package and to minimize the number of package design iterations. The package design improvement will be illustrated by the insertion loss, return loss, and time domain reflectometry (TDR). Our model provides an efficient way to improve package performance, and shows good correlations with the real design.
扇形输出插销系统的封装设计优化
人工智能(ai)、5G移动通信、网络服务器等尖端高速数字系统需要比传统技术更大的数据传输量、更宽的带宽和更快的数据速率。这就要求封装采用非常高密度的互连,同时提供具有成本效益的制造工艺和更好的性能。基于安装在高密度互连(HDI)基板上的面板级封装(PLP)中间层的新型混合封装平台可能是满足这些要求的有希望的解决方案。PLP中间层可以提供精细的间距以支持相当数量的信号走线,而HDI衬底可以在将信号从中间层扇出后作为相对便宜的互连。PLP中间层的另一个优点是,当在PLP中间层下方安装陆地侧电容器时,从凸点到封装去耦电容器的电感较低,因为PLP的衬底厚度可以比味之素积聚膜(ABF)薄。ABF中介器可以作为PLP中介器的替代方案。虽然ABF中间层的铜层和介电层比PLP中间层厚,但它可以实现更低的电阻,以满足高速IO所需的特性阻抗。然而,在中间层和HDI衬底之间存在连接球可能会引入额外的阻抗不连续,从而降低信号的完整性。因此,优化的封装设计和分析是设计此类封装平台的关键因素。本文从封装结构和设计优化角度对PLP封装、ABF封装和传统封装进行了比较。说明了每种封装平台的拓扑结构,并讨论了其优点和风险。为了优化设计,中间层和基板上的走线采用简单的t线模型来描述,而包括过孔、焊盘和球在内的垂直结构采用LC模型。使用简单模型的好处是为包的性能优化提供包设计指南,并最大限度地减少包设计迭代的次数。封装设计的改进将通过插入损耗、回波损耗和时域反射(TDR)来说明。该模型为提高封装性能提供了一种有效的方法,并与实际设计表现出良好的相关性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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