{"title":"Absolute calibration of optical flats using a commercial phase measuring interferometer","authors":"C. Evans, W. Estler, Robert E. Parks","doi":"10.1364/oft.1992.wa3","DOIUrl":null,"url":null,"abstract":"So called \"absolute\" calibration of optical flats can be performed using a range of algorithms, each with its own limitations. At NIST we have implemented, and are intercomparing, several techniques.","PeriodicalId":142307,"journal":{"name":"Optical Fabrication and Testing Workshop","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Fabrication and Testing Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/oft.1992.wa3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
So called "absolute" calibration of optical flats can be performed using a range of algorithms, each with its own limitations. At NIST we have implemented, and are intercomparing, several techniques.