P.M. Smith, P. Chao, L. Lester, R.P. Smith, B. Lee, D. W. Ferguson, A. Jabra, J. Ballingall, K. Duh
{"title":"InGaAs pseudomorphic HEMTs for millimeter wave power applications","authors":"P.M. Smith, P. Chao, L. Lester, R.P. Smith, B. Lee, D. W. Ferguson, A. Jabra, J. Ballingall, K. Duh","doi":"10.1109/MWSYM.1988.22183","DOIUrl":null,"url":null,"abstract":"The development of InGaAs pseudomorphic high-electron mobility transistors (HEMTs) with state-of-the-art power performance at millimeter-wave frequencies is reported. Results given include maximum power-added efficiencies of 44% at 35 GHz and 36% at 44 GHz, output power of 100 mW with 22% efficiency and 3-dB gain at 60 GHz, and output power of 9 mW at 94 GHz. Preliminary reliability data are presented, and prospects for further improvement in performance-the realization of multifinger HEMTs capable of higher output power and reduction of gate length to 0.1 mu m-are discussed.<<ETX>>","PeriodicalId":339513,"journal":{"name":"1988., IEEE MTT-S International Microwave Symposium Digest","volume":"145 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"36","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988., IEEE MTT-S International Microwave Symposium Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1988.22183","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 36
Abstract
The development of InGaAs pseudomorphic high-electron mobility transistors (HEMTs) with state-of-the-art power performance at millimeter-wave frequencies is reported. Results given include maximum power-added efficiencies of 44% at 35 GHz and 36% at 44 GHz, output power of 100 mW with 22% efficiency and 3-dB gain at 60 GHz, and output power of 9 mW at 94 GHz. Preliminary reliability data are presented, and prospects for further improvement in performance-the realization of multifinger HEMTs capable of higher output power and reduction of gate length to 0.1 mu m-are discussed.<>