Tanaporn Leelawattananon, W. Thowladda, S. Chittayasothorn
{"title":"Surface Roughness Measurement Application Using Multi-frame Techniques","authors":"Tanaporn Leelawattananon, W. Thowladda, S. Chittayasothorn","doi":"10.1109/CCATS.2015.30","DOIUrl":null,"url":null,"abstract":"This paper presents a computer application of the surface roughness measurement of highly smooth surfaces. The Phase Shifting Interferometry technique which is a non-contact technique is applied for the roughness measurement. Our optic-based measurement system utilizes a 0.5 mW He-Ne laser source with the wavelength of 632.8 nm. Fringes from the measurement system were recorded using a high precision camera and were analyzed by our programs to produce the surface roughness measurement. This technique is a simple technique which gives accurate results. It is a four-frame algorithm giving similar results to the more complex five-frame one with less processing time.","PeriodicalId":433684,"journal":{"name":"2015 International Conference on Computer Application Technologies","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 International Conference on Computer Application Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCATS.2015.30","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
This paper presents a computer application of the surface roughness measurement of highly smooth surfaces. The Phase Shifting Interferometry technique which is a non-contact technique is applied for the roughness measurement. Our optic-based measurement system utilizes a 0.5 mW He-Ne laser source with the wavelength of 632.8 nm. Fringes from the measurement system were recorded using a high precision camera and were analyzed by our programs to produce the surface roughness measurement. This technique is a simple technique which gives accurate results. It is a four-frame algorithm giving similar results to the more complex five-frame one with less processing time.