Coupled-Line Curvature Angle Effect on Bandpass Negative Group Delay Characteristics

Abstract

This paper investigates on the bandpass (BP) negative group delay (NGD) effect from CC-shaped circular curved coupled-line (CL) microstrip circuit. The innovative BP-NGD circuit is inspired from the li-microstrip topology. To verify the BP-NGD concept feasibility, an empirical study corroborating simulations is examined. Different properties of 180° and arbitrary angle CC microstrip structures are designed and simulated. Moreover, accurate sensitivity analyses were also performed by means of full-wave simulations.