High level test synthesis across the boundary of behavioral and structural domains

Abstract

High level test synthesis (HLTS), a term introduced in recent years, promises automatic enhancement of testability of a circuit. The authors show how HLTS can achieve higher testability for BIST oriented test methodologies. Their results show considering testability during high-level synthesis, better testability can be obtained when compared to DFT at low level. Transformation for testability, which allows behavioral modification for testability, is a very powerful HLTS technique.