Optical X-Ray Diffraction Data Analysis Using the Williamson–Hall Plot Method in Estimation of Lattice Strain-Stress

Abstract

Lattice stress and strain was analysed with estimated crystalline size of the synthesised ZnFe2O4 nanoparticles from x-ray diffraction data using Williamson-Hall (W-H) method. This very peculiar method was used to analyse the other physical parameters such as strain, stress, and energy density. Values calculated from the W-H method include uniform deformation model, uniform deformation stress model, and uniform deformation energy density model. These are very useful methods to label each data point on the Williamson-Hall plot according to the index of its reflection. Particularly, the root mean square value of strain was calculated from the interplanar distance using these three models. The three models have given different strain values by reason of the anisotropic nature of the nanopartcles. The average grain size of ZnFe2O4 nanoparticles estimated from FESEM image, Scherrer's formula, and W-H analysis is relatively correlated.