{"title":"Metasurface-based ultra-thin circular polarization analyzer integrated with semiconductor photodetectors","authors":"Junghoon Park, Kyoungsik Yu","doi":"10.23919/MOC.2017.8244629","DOIUrl":null,"url":null,"abstract":"We report on a metal-dielectric-metal (MDM) waveguide-based circular polarization analyzer with a sub-micron-scale thickness. By integrating nano-aperture metasurface and semiconductor photodetectors with the MDM structure, we can discriminate the handedness of circularly polarized light directly from the photocurrents without the usage of conventional optical components.","PeriodicalId":123743,"journal":{"name":"2017 22nd Microoptics Conference (MOC)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 22nd Microoptics Conference (MOC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/MOC.2017.8244629","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
We report on a metal-dielectric-metal (MDM) waveguide-based circular polarization analyzer with a sub-micron-scale thickness. By integrating nano-aperture metasurface and semiconductor photodetectors with the MDM structure, we can discriminate the handedness of circularly polarized light directly from the photocurrents without the usage of conventional optical components.