Unraveling Latch Locking Using Machine Learning, Boolean Analysis, and ILP

Dake Chen, Xuan Zhou, Yinghua Hu, Yuke Zhang, Kaixin Yang, A. Rittenbach, P. Nuzzo, P. Beerel
{"title":"Unraveling Latch Locking Using Machine Learning, Boolean Analysis, and ILP","authors":"Dake Chen, Xuan Zhou, Yinghua Hu, Yuke Zhang, Kaixin Yang, A. Rittenbach, P. Nuzzo, P. Beerel","doi":"10.1109/ISQED57927.2023.10129346","DOIUrl":null,"url":null,"abstract":"Logic locking has become a promising approach to provide hardware security in the face of a possibly insecure fabrication supply chain. While many techniques have focused on locking combinational logic (CL), an alternative latch-locking approach in which the sequential elements are locked has also gained significant attention. Latch (LAT) locking duplicates a subset of the flip-flops (FF) of a design, retimes these FFs and replaces them with latches, and adds two types of decoy latches to obfuscate the netlist. It then adds control circuitry (CC) such that all latches must be correctly keyed for the circuit to function correctly. This paper presents a two-phase attack on latch-locked circuits that uses a novel combination of deep learning, Boolean analysis, and integer linear programming (ILP). The attack requires access to the reverse-engineered netlist but, unlike SAT attacks, is oracle-less, not needing access to the unlocked circuit or correct input/output pairs. We trained and evaluated the attack using the ISCAS’89 and ITC’99 benchmark circuits. The attack successfully identifies a key that is, on average, 96.9% accurate and fully discloses the correct functionality in 8 of the tested 19 circuits and leads to low function corruptibility (less than 4%) in 3 additional circuits. The attack run-times are manageable.","PeriodicalId":315053,"journal":{"name":"2023 24th International Symposium on Quality Electronic Design (ISQED)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-04-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 24th International Symposium on Quality Electronic Design (ISQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED57927.2023.10129346","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Logic locking has become a promising approach to provide hardware security in the face of a possibly insecure fabrication supply chain. While many techniques have focused on locking combinational logic (CL), an alternative latch-locking approach in which the sequential elements are locked has also gained significant attention. Latch (LAT) locking duplicates a subset of the flip-flops (FF) of a design, retimes these FFs and replaces them with latches, and adds two types of decoy latches to obfuscate the netlist. It then adds control circuitry (CC) such that all latches must be correctly keyed for the circuit to function correctly. This paper presents a two-phase attack on latch-locked circuits that uses a novel combination of deep learning, Boolean analysis, and integer linear programming (ILP). The attack requires access to the reverse-engineered netlist but, unlike SAT attacks, is oracle-less, not needing access to the unlocked circuit or correct input/output pairs. We trained and evaluated the attack using the ISCAS’89 and ITC’99 benchmark circuits. The attack successfully identifies a key that is, on average, 96.9% accurate and fully discloses the correct functionality in 8 of the tested 19 circuits and leads to low function corruptibility (less than 4%) in 3 additional circuits. The attack run-times are manageable.
使用机器学习,布尔分析和ILP解开闩锁
面对可能不安全的制造供应链,逻辑锁定已经成为提供硬件安全的一种很有前途的方法。虽然许多技术都专注于锁定组合逻辑(CL),但另一种锁存锁定方法(其中锁定顺序元素)也得到了极大的关注。锁存器(LAT)锁定复制设计触发器(FF)的一个子集,对这些FF进行计时并用锁存器替换它们,并添加两种类型的诱饵锁存器来混淆网表。然后,它增加了控制电路(CC),以便所有锁存器必须正确地键合,以使电路正常工作。本文提出了一种针对锁存锁电路的两阶段攻击,该攻击使用了深度学习、布尔分析和整数线性规划(ILP)的新颖组合。这种攻击需要访问反向工程的网络列表,但与SAT攻击不同的是,它不需要访问未解锁的电路或正确的输入/输出对。我们使用ISCAS ' 89和ITC ' 99基准电路对攻击进行了训练和评估。攻击成功地识别了一个密钥,平均准确率为96.9%,并在测试的19个电路中的8个中完全揭示了正确的功能,并在另外3个电路中导致低功能腐败(低于4%)。攻击运行时是可管理的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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