C. Escudero, R. Delmas, Thomas Bochot, M. David, V. Wiels
{"title":"Automatic Generation of DO-178 Test Procedures","authors":"C. Escudero, R. Delmas, Thomas Bochot, M. David, V. Wiels","doi":"10.1007/978-3-319-77935-5_27","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":436677,"journal":{"name":"NASA Formal Methods","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"NASA Formal Methods","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-319-77935-5_27","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
京公网安备 11010802042870号
求助内容：
应助结果提醒方式：
