Bonding strength of Cu-to-Cu joints using Cu cold spray deposition by an oxidation and reduction process for power device package

Juncai Hou, Chengxin Li, Sijie Huang, H. Nishikawa
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Abstract

Reliable die-attach bonding is critical for high temperature electronic packaging. A Cu-to-Cu bonding was attempted by using an in stiu nanocrystallized surface on commerical microscale Cu cold spray deposition without using organic solvents. During sintering at 300 °C, Cu2O nano particles were formed on the surface of the cold spray deposition and then were reduced into Cu nano particles by formic acid. The shear strength reaches 20.7 MPa under applied pressure of 5 MPa and was increased with an increase of applied pressure. The formation of nanoparticles lead to a much higher shear strength compared to the joint fabricated by using microscale Cu particles. Cu2O would be further oxidized at higher temperature transferring into CuO and consequently CuO would be firstly reduced to Cu2O gradually. Subsequently, Cu2O can be reduced into Cu finally. Controlling the oxidation temperature could achieve Cu-to-Cu bonding quickly. An economical approach to implement Cu-to-Cu bonding was established.
功率器件封装用Cu冷喷涂氧化还原工艺制备Cu- Cu接头的结合强度
可靠的粘接是高温电子封装的关键。在不使用有机溶剂的情况下,在商业微尺度Cu冷喷涂沉积中,采用原位纳米晶表面进行Cu- Cu键合。在300℃的烧结过程中,冷喷涂沉积表面形成Cu2O纳米颗粒,然后通过甲酸还原成Cu纳米颗粒。施加压力为5 MPa时,抗剪强度达到20.7 MPa,随施加压力的增大而增大。纳米颗粒的形成使接头的抗剪强度大大高于使用微米级铜颗粒制备的接头。Cu2O在高温下进一步氧化转化为CuO, CuO首先逐渐还原为Cu2O。随后,Cu2O最终被还原为Cu。控制氧化温度可以快速实现cu - cu键合。建立了一种经济的实现cu - cu键合的方法。
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