V. d’Alessandro, P. Guerriero, S. Daliento, M. Gargiulo
{"title":"Accurately extracting the shunt resistance of photovoltaic cells in installed module strings","authors":"V. d’Alessandro, P. Guerriero, S. Daliento, M. Gargiulo","doi":"10.1109/ICCEP.2011.6036371","DOIUrl":null,"url":null,"abstract":"A straightforward non-invasive method is proposed to accurately evaluate the shunt resistance of an elementary cell of a photovoltaic module connected in an installed string without the need of preliminary knowledge of the intrinsic diode parameters. The approach relies on the measurement of the current-voltage characteristic of the whole string after intentionally shading the selected cell. Calibrated PSPICE simulations are employed to both illustrate and test the method. As a case study, the shunt resistances of several cells belonging to a series array of 10 commercial modules are determined.","PeriodicalId":403158,"journal":{"name":"2011 International Conference on Clean Electrical Power (ICCEP)","volume":"499 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 International Conference on Clean Electrical Power (ICCEP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCEP.2011.6036371","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20
Abstract
A straightforward non-invasive method is proposed to accurately evaluate the shunt resistance of an elementary cell of a photovoltaic module connected in an installed string without the need of preliminary knowledge of the intrinsic diode parameters. The approach relies on the measurement of the current-voltage characteristic of the whole string after intentionally shading the selected cell. Calibrated PSPICE simulations are employed to both illustrate and test the method. As a case study, the shunt resistances of several cells belonging to a series array of 10 commercial modules are determined.