H. Debéda, I. Favre, A. Gracia, N. Labat, B. Plano, H. Frémont
{"title":"A one week-lecture in the Euro-dots course program: Microelectronic assemblies: From packaging to reliability","authors":"H. Debéda, I. Favre, A. Gracia, N. Labat, B. Plano, H. Frémont","doi":"10.1109/EAEEIE.2013.6576514","DOIUrl":null,"url":null,"abstract":"The course “Microelectronic assemblies: from packaging to reliability” is a one-week-course module within the Euro-dots program proposed at the IMS Laboratory, University Bordeaux, with lectures illustrated by labs. It takes benefits from expertise of different teachers and research teams and also technological, failure analysis and characterization platforms.","PeriodicalId":326600,"journal":{"name":"2013 24th EAEEIE Annual Conference (EAEEIE 2013)","volume":"216 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 24th EAEEIE Annual Conference (EAEEIE 2013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EAEEIE.2013.6576514","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The course “Microelectronic assemblies: from packaging to reliability” is a one-week-course module within the Euro-dots program proposed at the IMS Laboratory, University Bordeaux, with lectures illustrated by labs. It takes benefits from expertise of different teachers and research teams and also technological, failure analysis and characterization platforms.