Marks on Single-Crystal Copper Cathodes after Short-Pulse Voltage Impact on Vacuum Gaps

E. Nefedtsev, S. Onischenko
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引用次数: 1

Abstract

The objects of experimental research were vacuum gaps (VGs) with electrochemically polished copper single-crystalline cathodes. VGs were exposed to short (20 ns) voltage pulses of high (200 kV) and low (25 kV) voltage amplitudes. The results indicate that plastic phenomena occurring inside the electrode material with the participation of linear defects of crystal structure play a significant role in the development of vacuum breakdown.
短脉冲电压对真空间隙影响后单晶铜阴极上的痕迹
实验研究的对象是电化学抛光铜单晶阴极的真空间隙。VGs暴露于高(200 kV)和低(25 kV)电压幅值的短(20 ns)电压脉冲中。结果表明,在晶体结构线性缺陷的参与下,电极材料内部发生的塑性现象对真空击穿的发展起着重要作用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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