Estimation of Storage Life of Electronic Components Based on Degradation Analysis

2018 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2018-09-01 DOI:10.1109/EWDTS.2018.8524786

A. Koulibaba, A. Y. Shtukarev, A. A. Sashoy, O. Yushin

引用次数: 0

Abstract

This article presents one of the ways to use built-in self-test. A method for estimating of storage life of integrated circuits based on predicting the degradation of parameters measured during self-test is proposed.

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基于退化分析的电子元件贮存寿命估计

本文介绍了一种使用内置自检的方法。提出了一种基于自测参数退化预测的集成电路存储寿命估计方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2018 IEEE East-West Design & Test Symposium (EWDTS)

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