Methodical principles of a choice of simulators for tests of electronic devices for immunity to ultrashort EMPs

Abstract

Shortcomings of the standard ways for tests of electronic devices for immunity to ultrashort electromagnetic pulses (US EMPs) are considered. The method of a choice of simulators being based on use of key parameters of the pulse electric disturbances induced in critical circuits of equipment is offered. This method allows choosing the simulator or some simulators providing the most severe conditions of tests.