Test for end connection integrity of metalized film capacitors

Abstract

The wire arc metal sprayed end connections of metalized film capacitors limit their performance for high current discharge applications. We have developed a solid state discharge circuit with integrated current-induced partial discharge detector to evaluate the quality of end connections with a single high current discharge, and we have demonstrated a strong correlation between this test and winding discharge life. Such a test can be very useful to the industry, as if the quality of individual windings can be assured, a large capacitor made from many such windings will have greatly improved dis-charge performance and reliability.