Emmanuel Viennet, Nicolas Ramosaj, Christian Fusco
{"title":"Development of a Hardware-in-the-Loop Test Bench for Validation of an ABS System on an e-Bike","authors":"Emmanuel Viennet, Nicolas Ramosaj, Christian Fusco","doi":"10.59490/649d9ceb4adb98a3b887079f","DOIUrl":null,"url":null,"abstract":"The availability of electric energy onboard e-bikes allows the emergence of active safety systems like antilock braking systems (ABS). This paper presents the development of a test-bench that can be leveraged to validate an e-bike ABS for multiple bicycle geometry, loading and test scenarios. The approach consists in reproducing the dynamics of an e-bike thanks to a simulation model and interfacing it with a physical brake and the ABS hardware under test. The results and useability of the obtained hardware-in-the-loop (HiL) test-bench are discussed.","PeriodicalId":141471,"journal":{"name":"The Evolving Scholar - BMD 2023, 5th Edition","volume":"143 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Evolving Scholar - BMD 2023, 5th Edition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.59490/649d9ceb4adb98a3b887079f","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The availability of electric energy onboard e-bikes allows the emergence of active safety systems like antilock braking systems (ABS). This paper presents the development of a test-bench that can be leveraged to validate an e-bike ABS for multiple bicycle geometry, loading and test scenarios. The approach consists in reproducing the dynamics of an e-bike thanks to a simulation model and interfacing it with a physical brake and the ABS hardware under test. The results and useability of the obtained hardware-in-the-loop (HiL) test-bench are discussed.