Generating higher output power signals for today's test applications

Abstract

High test signal power provides multiple advantages within the RF test environment. It can mean greater accuracy of measurements and the ability to evaluate devices over a larger dynamic range. This in turn results in a wider breadth of capability from the test system ensuring coverage of the boundary conditions that may affect system readiness. Long cable runs and switch matrices that consume signal power before the test signal gets to the device under test aggravate the problem.