Advanced scanning probe techniques and materials research

Abstract

In this special issue we have included a research article, where the heterostructure of 2D materials CrTe2/Bi2Te3 prepared by molecular beam epitaxy has been studied by STM/STS. In addition, selected topical reviews on the application of STM and AFM on carbon-based materials, 2D materials as well as topological materials have been included. We expect that this special issue will provide some basic concept of the materials physics, which can be revealed by advanced scanning probe techniques.