J. Millitzer, D. Mayer, C. Henke, T. Jersch, C. Tamm, Jan Michael, C. Ranisch
{"title":"Recent Developments in Hardware-in-the-Loop Testing","authors":"J. Millitzer, D. Mayer, C. Henke, T. Jersch, C. Tamm, Jan Michael, C. Ranisch","doi":"10.1007/978-3-319-74793-4_10","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":278140,"journal":{"name":"Model Validation and Uncertainty Quantification, Volume 3","volume":"89 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Model Validation and Uncertainty Quantification, Volume 3","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-319-74793-4_10","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}