{"title":"A sensitivity study of ray-tracing based wireless channel simulators using field measurements","authors":"F. Aryanfar, F.B. Turney, L. Malek, N. Buris","doi":"10.1109/APS.2007.4395919","DOIUrl":null,"url":null,"abstract":"Toward the goal of achieving robust ray tracing based channel models this paper compares simulation results using a 3D ray-tracing tool [F. Aryanfar and S. Safavi-Naeini, 1998] vs. field measurements in different environments. The tool has been validated for many outdoor and indoor scenes at different frequency bands and is capable of accurate prediction of wireless channel parameters. To test model robustness, we also examine the sensitivity of the predicted results on inputs such as angular resolution, material properties and detail of geometry.","PeriodicalId":117975,"journal":{"name":"2007 IEEE Antennas and Propagation Society International Symposium","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Antennas and Propagation Society International Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APS.2007.4395919","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Toward the goal of achieving robust ray tracing based channel models this paper compares simulation results using a 3D ray-tracing tool [F. Aryanfar and S. Safavi-Naeini, 1998] vs. field measurements in different environments. The tool has been validated for many outdoor and indoor scenes at different frequency bands and is capable of accurate prediction of wireless channel parameters. To test model robustness, we also examine the sensitivity of the predicted results on inputs such as angular resolution, material properties and detail of geometry.