C. Tien, Tsai-Wei Lin, H. Hsu, Li-Chieh Chen, Yu-Chung Chen, Wen-Feng Liu
{"title":"Double-sided polishing long period fiber grating sensors for measuring liquid refractive index","authors":"C. Tien, Tsai-Wei Lin, H. Hsu, Li-Chieh Chen, Yu-Chung Chen, Wen-Feng Liu","doi":"10.1364/ACP.2009.WL93","DOIUrl":null,"url":null,"abstract":"A new liquid refractive index sensor using double-sided polishing long-period fiber gratings (DSP-LPFG) is presented. The influence of residual cladding thickness on the sensitivity of measuring liquid refractive index is investigated. The proposed sensor response to external liquid refractive indices varying in the range of n=1.330 − 1.375 has been carried out by measuring the transmission wavelength changes. Experimental results show that well-controlled polishing parameters can significantly increase the sensitivity. The sensitivity of −143.396 nm/RIU can be obtained in this study.","PeriodicalId":366119,"journal":{"name":"2009 Asia Communications and Photonics conference and Exhibition (ACP)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 Asia Communications and Photonics conference and Exhibition (ACP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/ACP.2009.WL93","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A new liquid refractive index sensor using double-sided polishing long-period fiber gratings (DSP-LPFG) is presented. The influence of residual cladding thickness on the sensitivity of measuring liquid refractive index is investigated. The proposed sensor response to external liquid refractive indices varying in the range of n=1.330 − 1.375 has been carried out by measuring the transmission wavelength changes. Experimental results show that well-controlled polishing parameters can significantly increase the sensitivity. The sensitivity of −143.396 nm/RIU can be obtained in this study.