{"title":"Including EMC in risk assessments","authors":"K. Armstrong","doi":"10.1109/ISEMC.2010.5711381","DOIUrl":null,"url":null,"abstract":"The reliability of electronic technologies (including the software and firmware that runs on them) can become critical, when the consequences of errors, malfunctions or other types of failure include significant financial loss, mission loss, or harm to people, domestic animals or property (i.e. functional safety).","PeriodicalId":201448,"journal":{"name":"2010 IEEE International Symposium on Electromagnetic Compatibility","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2010.5711381","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
The reliability of electronic technologies (including the software and firmware that runs on them) can become critical, when the consequences of errors, malfunctions or other types of failure include significant financial loss, mission loss, or harm to people, domestic animals or property (i.e. functional safety).