Characterization of 3-port SAW diplexers using 2-port VNA measurements

Abstract

A simple approach to the on-wafer characterization of 3-port surface acoustic wave (SAW) diplexers using S- to Z- parameter conversion is proposed. The concept is first tested on a simple power divider model. The model is based on ideal transmission line elements and open circuit blocks. The results are excellent with total S-parameter errors below 10−9• The technique is then successfully applied to X-band delay line type 3-port SAW circuits connected using 50 Ohm characteristic impedance coplanar waveguide (CPW) transmission lines.