A unified circuit model for ferroelectrics

Abstract

We present a physical circuit model for polarization reversal dynamics in ferroelectrics, which is implemented in Verilog-A, validated with PZT measurements and applicable in all operation modes for bulk, epitaxial and polycrystalline thin films. Consistent treatment of field-driven polarization not only gives accurate step-voltage responses across many decades in time, but also reproduces frequency and amplitude dependent P-E and I-V hysteresis loops for ferroelectric MIM capacitors. FE-RAM and gate-stack FE-FET circuit simulations are experimentally verified.