Breakdown strength of impregnated capacitor elements

2016 IEEE International Conference on Dielectrics (ICD) Pub Date : 2016-07-03 DOI:10.1109/ICD.2016.7547695

C. Guillermin, S. Fontana

引用次数: 3

Abstract

The dielectric strength of unaged and aged capacitor elements is described using a 2-parameters Weibull statistical analysis. The experimental results suggest that aged elements can be split in two populations. The electric stress at the electrode edge is shown to be an important parameter regarding the decrease of dielectric strength. A threshold value of the stress in this area was determined from the bibliography and is confirmed by the experimental evidence.

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浸渍电容器元件的击穿强度

用二参数威布尔统计分析方法描述了未老化和老化电容器元件的介电强度。实验结果表明，老化元素可以分成两个种群。电极边缘的电应力是影响介质强度降低的一个重要参数。根据文献确定了该区域的应力阈值，并通过实验验证。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2016 IEEE International Conference on Dielectrics (ICD)

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