{"title":"A Coupled Electrical-Mechanical-Thermal Analysis of EHV Disconnecting Switch for Short Circuit Current Condition","authors":"Y. Oh, K. Song, W.Y. Lee, S. Hahn","doi":"10.1109/CEFC-06.2006.1632830","DOIUrl":null,"url":null,"abstract":"This paper presents the performance prediction technique of a disconnecting switch in case of short circuit current conduction. The thermal characteristics caused by the applied force to the contacts and contact resistance are analyzed by solving a coupled electrical-mechanical-thermal problem","PeriodicalId":262549,"journal":{"name":"2006 12th Biennial IEEE Conference on Electromagnetic Field Computation","volume":"222 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 12th Biennial IEEE Conference on Electromagnetic Field Computation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEFC-06.2006.1632830","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This paper presents the performance prediction technique of a disconnecting switch in case of short circuit current conduction. The thermal characteristics caused by the applied force to the contacts and contact resistance are analyzed by solving a coupled electrical-mechanical-thermal problem