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Defect localization in noisy fringe patterns using subspace method and naive Bayes classifier

OSA Optical Sensors and Sensing Congress 2021 (AIS, FTS, HISE, SENSORS, ES) Pub Date : 1900-01-01 DOI:10.1364/ais.2021.jth6a.31
J. Ramaiah, R. Gannavarpu
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基于子空间方法和朴素贝叶斯分类器的噪声条纹缺陷定位
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OSA Optical Sensors and Sensing Congress 2021 (AIS, FTS, HISE, SENSORS, ES)
OSA Optical Sensors and Sensing Congress 2021 (AIS, FTS, HISE, SENSORS, ES)
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